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6625-00-777-2091

Semiconductor Device Test Set

6625007772091 007772091

A test set specifically designed for use in making examinations of diodes, transistors, and the like. These examinations may be effected in or out of circuit or both. View more Semiconductor Device Test Set

6625-00-777-2091 TEST SET,SEMICONDUCTOR DEVICE 6625007772091 007772091

Managed by United States
NSN Created on 1 Jan 1963
Data Last Changed
November 2023
NATO Update Count
5
NATO Data Quality
6625-00-777-2091 TEST SET,SEMICONDUCTOR DEVICE 6625007772091 007772091 1/1
NSN 6625-00-777-2091 (Generic Image) 1/1

6625-00-777-2091 Stock and Availability Marketplace 6625-00-777-2091

6625-00-777-2091 Related Documents Related Documents 6625-00-777-2091 5+ Documents (More...)

6625143236349 Set 6625997912989 362-3839 6625-00-844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
6625-14-337-0938 Set 6625997359629 362-3839 6625-00-844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
6625-14-337-0938 Set 6625140414955 362-3839 6625-00-844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
Semiconductor Device Test Set 6625997912989 362-3839 6625-00-844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
Semiconductor Device Test Set 6625997359629 362-3839 6625-00-844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
Semiconductor Device Test Set 6625140414955 362-3839 6625-00-844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
-9101 Semiconductor Device Test Set 6625251189101 844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
-2989 Semiconductor Device Test Set 6625997912989 844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
-7100 Semiconductor Device Test Set 6625251157100 844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
6625143236349 Set 6625997912989 362-3839 6625-00-844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091
Test Set 6625140414955 362-3839 6625-00-844-7105 https//www.nsnlookup.com /fsg-66/fsc-6625/us 6625-00-777-2091
Semiconductor Device Test Set 6625007772091 337-0938 Semiconductor Device Test Set 6625143370938
nato-stock-numbers/inc Semiconductor Device Test Set (INC 25006) Semiconductor Device Test Set 1 Jan 1963 6625-00-777-2091
132-7328 6625-25-105-8589 6625-01-362-3839 6625-00-844-7105 6625-98-105-3536 6625-01-316-6512 6625-00-777-2091

6625-00-777-2091 Demil Restrictions 6625-00-777-2091

DEMIL: A | DEMILI: | CRITICALITY: X | HMIC: P | PMIC: A | EDC: | ADPEC: 0

6625-00-777-2091 is a Semiconductor Device Test Set that does not have a nuclear hardened feature or any other critical feature such as tolerance, fit restriction or application. This item is considered a low risk when released from the control of the Department of Defense. The item may still be subject to the requirements of the Export Administration Regulations (EAR) and the Code of Federal Regulations (CFR). This item may be hazardous as it is in a Federal Supply Class for potentially hazardous items. A MSDS should be available from the supplier for the end user to evaluate any hazards. This item does not contain a precious metal.

6625-00-777-2091 Management Data Management Data 6625-00-777-2091

Effective Date
Organization
Unit of Issue
Unit Price
Qty Unit Pack
Nov 2002
Department of the Air Force (DF)
EA
Subscribe
1
MOE
USC
Code
Statement
Order of Use
Jump To Code
Qty Per Assy
UOM
Technical Document
Quantative Expression
Department of the Air Force (DF)
L
Z
Discontinued-Use 6625-00-902-5583

Air Force Air Force

Budget:
M
57X3080 - Other Base Maintenance and Support Equipment
Aggregation Code:
RH
AUTO TEST EQUIPMENT/AUTO TEST SYSTEMS (ATE/ATS) (FSC RESIDUAL MMAC)
Price Validation Code:
N
The current standard price in Catalog Management Data (CMD) has not analyzed or coded for LP/LM.
The price has not been analyzed or reviewed for accuracy.
ZOP or Standard price challenges are permissible but must be supported with adequate justification. However, if coded for Local Purchase (LP) or Fabrication/Manufacture as indicated with an (LM) Acquisition Advice Code of ā€œLā€ or ā€œFā€, then it must be evaluated locally where purchased or fabricated.
Expendability
Recoverability
Repairability:
S
Reparable. Condemn at Depot. AF Equipment Management System (AFEMS).

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